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Components For Semiconductor Inspection Equipment

We manufacture and sell "Microcontactor", which we have independently developed as a new type of contact probe structure.

Microcontactor are used for testing electrical characteristics of semiconductor wafers and semiconductor packages. We produce various products in-house and can also customize product designs to meet your needs.

Strengths of "Microcontactor" (Our contact probes)

 

Introduction of our contact probe "Microcontactor" used in semiconductor test jig and its five strengths

 

What is a semiconductor test jig?

Semiconductor test is the process of applying electricity to a semiconductor product to check if it works properly. Semiconductor Test Equipment is used in the test. Input signals are generated based on a test program created for each inspecting semiconductor products, and are compared with the output signals (expected values). Test is performed after the circuit is generated on the semiconductor wafer, called front-end process, and after the semiconductor product is assembled, called back-end process.
Semiconductor Test Fixture serves as a connection between semiconductor products and semiconductor testing equipment. NHK Spring provides probe cards (probe heads) for front-end processes and test sockets for back-end processes to semiconductor product manufacturers and related companies around the world.

Diagram showing the semiconductor manufacturing processes and microcontactor Products
Semiconductor Manufacturing Processes & Microcontactor Products
Contact Probes

Contact Probes

Contact probes are inspection terminals used in semiconductor product testing. Electrical signals output from semiconductor test equipment are sent to semiconductor products through contact probes.

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Test sockets

Test sockets

These are inspection jigs used for final inspection following semiconductor product assembly. This is called the "back-end process" of the semiconductor manufacturing process.

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Inspection Characteristics

Inspection Characteristics

Narrow pitch units with a pitch of 200 µm or less and high-frequency measurement are introduced here.

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