Microcontactor (HCP Series)
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PRODUCT NAME
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Microcontactor (HCP Series)
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PRODUCT CATEGORY
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Components for Semiconductor Inspection Equipment (Contact Probe Related Products)
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INDUSTRY/SITUATION OF USE
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Information and Communication Related / Semiconductor Manufacturing Equipment
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FUNCTIONS
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Conduction Inspection
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OUTLINE
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The HCP series is a type of contact probes used in semiconductor inspection equipment to improve electrical stability.
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CHARACTERISTICS
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In HCP series probes, because the plunger on the semiconductor product side and the plunger on the test equipment side are in contact internally, resistance is reduced and other electrical characteristics are improved.
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