Microcontactor (NIC Series)
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PRODUCT NAME
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Microcontactor (NIC Series)
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PRODUCT CATEGORY
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Components for Semiconductor Inspection Equipment (Contact Probe Related Products)
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INDUSTRY/SITUATION OF USE
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Information and Communication Related / Semiconductor Manufacturing Equipment
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FUNCTIONS
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Conduction Inspection
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OUTLINE
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NIC series contact probes, used in semiconductor inspection equipment, have high-frequency characteristics.
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CHARACTERISTICS
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This series is currently under development. Please contact us for details.
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