Surprising 51,552
51,552 Probe pins
That is ...
The number of micro-contactor pins
The combination of high-precision, ultra-fine processing technologies
The probe card for full wafer level testing (FWLT), used for semiconductor inspection, is one of our micro-spring technology products. Over an area measuring 30cm in diameter, 51,552 probe pins stand at a pitch of 0.2 mm. Such applications for inspection of electric vehicle devices are a growth area.
![](https://www.nhkspg.co.jp/hubfs/nhkspg.co.jp/images/products/production%20data/metalworking_molding/metalworking_molding_02.jpg)
![](https://www.nhkspg.co.jp/hubfs/nhkspg.co.jp/images/products/production%20data/23010.jpg)